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Multi-lane differential serial fabric test card for VPX
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Lab-on-board eliminates need for acquiring a whole rack of equipment
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Directly evaluate true Gbps serial link BER performance inside chassis
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Test and characterize entire multi-lane serial fabric with one integrated module
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Achieve lowest cost of test and fastest time to market
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Can be used for testing both line cards and backplanes
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MicroTCA and other form factors available soon
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Datenblatt/Broschüre
More Info/Accessories
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